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piezoeletric

2atomic force microscope (AFM) 2nanopositioning 1AFM probe 1cantilever 1control 1high speed 1microcantilevers 1microsensors 1motion control 1noise 1piezoelectric shunt control 1resolution 1scanning probe microscopy 1strain sensor 1synthetic impedance 1tapping-mode AFM

2Fleming, Andrew J. 2Moheimani, S. O. Reza 1Fairbairn, Matthew W. 1Müller, Philipp 1Yong, Yuen Kuan

Date

22014 12013

Facets

2atomic force microscope (AFM) 2nanopositioning 1AFM probe 1cantilever 1control 1high speed 1microcantilevers 1microsensors 1motion control 1noise 1piezoelectric shunt control 1resolution 1scanning probe microscopy 1strain sensor 1synthetic impedance 1tapping-mode AFM

2Fleming, Andrew J. 2Moheimani, S. O. Reza 1Fairbairn, Matthew W. 1Müller, Philipp 1Yong, Yuen Kuan

Date

22014 12013

Title
Creator
Date

Measuring and predicting resolution in nanopositioning systems

- Fleming, Andrew J.

Creator: Fleming, Andrew J.
Resource Type: journal article
Date: 2014

Sensorless implementation of a PPF controller for active Q control of an AFM microcantilever

- Fairbairn, Matthew W., Müller, Philipp, Moheimani, S. O. Reza

Creator: Fairbairn, Matthew W. , Müller, Philipp , Moheimani, S. O. Reza
Resource Type: journal article
Date: 2014

A novel piezoelectric strain sensor for simultaneous damping and tracking control of a high-speed nanopositioner

- Yong, Yuen Kuan, Fleming, Andrew J., Moheimani, S. O. Reza

Creator: Yong, Yuen Kuan , Fleming, Andrew J. , Moheimani, S. O. Reza
Resource Type: journal article
Date: 2013

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